Takano Y., Hoshi K., Mizuguchi Y., Yamashita A., Miura A., Matsumoto R., Nakahira Y., Yamane K., Kadobayashi H., Kawaguchi S.I.
Ключевые слова: chalcogenide, FeSe, wires, doping effect, fabrication, sintering, PIT process, ex-situ process, X-ray diffraction, microstructure, resistivity, temperature dependence, resistive transition, magnetic field dependence, upper critical fields, critical caracteristics, current-voltage characteristics, experimental results
Holzapfel B., Yamaguchi T., Iida K., Takeya H., Takano Y., Tanaka M., Fujioka M., Demura S., Okazaki H., Yamashita A., Denholme S.J., Sakata H.
Ключевые слова: chalcogenide, FeSe, RABITS process, tapes, electrochemical process, fabrication, critical temperature, susceptibility
Ключевые слова: HTS, Bi2212, nanodoping, nanoscaled effects, fabrication, bulk, doping effect, lattice parameter
Ключевые слова: chalcogenide, tapes, PIT process, fabrication, microstructure, X-ray diffraction, magnetization
Watanabe T., Yamaguchi T., Kumakura H., Takeya H., Takano Y., Ozaki T., Mizuguchi Y., Deguchi K., Kawasaki Y., Demura S., Okazaki H., Hara H.
Ключевые слова: LTS, FeSe, wires, resistive transition, magnetization, critical caracteristics, Jc/B curves, experimental results, quench state
Ключевые слова: oxypnictides, wires, fabrication, ex-situ process, diffusion process, sheath, composition
Yamaguchi T., Kumakura H., Tanaka T., Takano Y., Ozaki T., Mizuguchi Y., Deguchi K., Tsuda S., Kawasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, measurement technique, critical current density, damage mechanisms
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Takano Y., Ozaki T.
Ключевые слова: HTS, REBCO, films, nanoscaled effects, nanorods, nanodoping, doping effect, fabrication, microstructure, magnetic properties, irreversibility fields, critical caracteristics, Jc/B curves, critical current density, angular dependence, magnetic field dependence, experimental results, pinning
Nakamura T., Yamada M., Hirano S., Takano Y., Saito A., Takeishi K., Suzuki T., Sekiya N., Yoko M., Ohshima S.(ohshima@yz.yamagata-u.ac.jp), Watanabe T.(watanabe@te.noda.sut.ac.jp)
Nakamura T., Mukaida M., Saito A., Ohshima S., Takeishi K., Takano Y.(tsion@pop02.odn.ne.jp), Suzuki T., Yokoo M.
Ключевые слова: measurement technique, critical current density, HTS, films, YBCO, critical caracteristics
Kikuchi M., Matsuzawa H.(matuzawa@es.yamanashi.ac.jp), Tamaki H., Ohashi W., Kakimoto E., Dohke K., Atou T., Fukuoka K., Kawasaki M., Takano Y.
Ключевые слова: MgB2, bulk, fabrication, grain boundaries, resistive transition, microstructure
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